TRAN , T. T.; HOANG , T. H.; DUONG , T. T.; PARK, H.-S. . A study of void fraction correlations used slip-ratio models. Nuclear Science and Technology, [S. l.], v. 12, n. 3, p. 34-44, 2026. DOI: 10.53747/nst.v12i3.394. Disponível em: http://45.120.228.68/index.php/nst/article/view/502. Acesso em: 24 aug. 2026.